It seems like the next phase of this effort needs to be driven by suggestions from users on the right set of compare fields. The MCU fields are just not very helpful. I will be sending in my suggestions and I hope others will too.
I guess in this case it would have to be the datasheet from which 'normalized' data was taken. I should have made that clear...I guess I was also looking for some place to archive the originals or variations.
hi bcarso: thanks for the kudos. I like where you're going with that last comment. Someday... Just need a few more datapoints for our maximum likelihood counterfeit prediction algorithm. Have you had counterfeit issues yourself?
Good idea, and promising initial implementation it sounds like.
I feel like kidding a bit here as I know these things are outside the scope, but wouldn't it be nice to see "likelihood the part you buy is counterfeit", as well as a "predicted longevity in standard distribution" parameter?
But seriously, nice to see the effort and something more than the usual batch grab for google rank.
I applaud the efforts as well. However, it would be good to cache the original datasheets in whatever form in addition to the normalized ones. You know the originals of older stuff are getting harder to find as manufacturers take them out of their lineup.
As we unveil EE Times’ 2015 Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. Panelists Dan Armbrust (investment firm Silicon Catalyst), Andrew Kau (venture capital firm Walden International), and Stan Boland (successful serial entrepreneur, former CEO of Neul, Icera) join in the live debate.