thank you @agk...static body bias would just shift VTH permanently so it will not solve anything...how would dynamic bias work? low VTH when in operation and high VTH when powered off?...I thought the same trick is used in many processes (like SOI for example)...Kris
My understanding is that the text book challenge to increased leakage current in bulk CMOS is because of the depth of the transistor channel
Like FinFET and FDSOI, DDC has a shallow and tightly controlled channel. Unlike FinFET DDC can support multiple VTs easily.
thank you Peter...low VDD operation requires low VTH...but a textbook challenge of lowering VTH is increased leakage current (it is an exponential increase), perhaps someone from SuVolta can explain how they have overcome that challenge...Kris
I don't think it is made explicit exactly where the work was done. But I think it is safe to assume it was done at a Fujitsu wafer fab or research fab where they can run the 65-nm CMOS manufacturing process.
SuVolta continues to come up with very exciting announcements...but how one develops very advanced transistor structures without access to a state-of-the-art fab?...was the work done at Fujitsu's facilities? Kris
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.