Breaking News
Comments
Newest First | Oldest First | Threaded View
old account Frank Eory
User Rank
Author
re: Test problems grow as chip integration increases
old account Frank Eory   2/20/2012 11:32:08 PM
NO RATINGS
I have been hearing about designers ignoring DFT since the 90s, and yet on every design team I have been a member of, DFT was always a major task and was addressed up front -- as a much a part of the chip requirements as any functional requirements. You're right, analog testing is still lacking automation and this is a big problem in reducing test time for AMS SoCs. Hopefully the EDA community will put some effort into that.

scanman
User Rank
Author
re: Test problems grow as chip integration increases
scanman   2/20/2012 10:49:12 PM
NO RATINGS
For too long designers have focussed on getting every bit of functionality and relegated test to the backend. However, DFT is taking foothold in almost all design groups, and helping ease the manufacturing problem. Most of DFT technology has been developed to tackle digital testing, and analog, m/s testing is still a problem, not well-defined and left to smart engineers to come up with solutions. Need more work in these areas to automate testing of SoCs populated by a mix of digital, analog, m/s cores and logic.

MSSN
User Rank
Author
re: Test problems grow as chip integration increases
MSSN   2/19/2012 12:31:22 PM
NO RATINGS
Breakpoints and infinite probes are a big difference between software and silicon debugging

Kinnar
User Rank
Author
re: Test problems grow as chip integration increases
Kinnar   2/18/2012 11:08:20 AM
NO RATINGS
Increasing no of peripherals and cores puts the "design for test" in a critical situation as the area covered by the test sets increases then the required by the actual chip. But this will be solved as the "Design for Test" is a hot topic among the researchers.

Kinnar
User Rank
Author
re: Test problems grow as chip integration increases
Kinnar   2/18/2012 11:05:53 AM
NO RATINGS
Testing and debugging Silicon Chips is much more complicated as compared to software programs. If the design does not work out there is no means of debugging and correcting once done. All the tests are made in simulation environment, where as in case of software you can come with as many versions of a simple .dll as well.

DrQuine
User Rank
Author
re: Test problems grow as chip integration increases
DrQuine   2/18/2012 4:10:00 AM
NO RATINGS
Fundamentally, testing and debugging silicon chips is the same problem as testing and debugging software programs. The only difference is that one ends up in silicon and wires whereas the other is stored in magnetic domains. Start by studying best practices in software programming and quality control.



Datasheets.com Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
Like Us on Facebook
Special Video Section
5G LTE is on the way. These systems will require more ...
Protecting sensitive electronic circuitry from voltage ...
09:45
Watch as a web server authenticates or rejects a water ...
Protecting sensitive electronic circuitry from voltage ...
Watch as a web server authenticates or rejects a water ...
Protecting sensitive electronic circuitry from voltage ...
Power can be a gating factor in success or failure of ...
Get to market faster and connect your next product to the ...
00:44
See how microQSFP is setting a new standard for tomorrow’s ...
The LTC3649 step-down regulator combines key features of a ...
Once the base layer of a design has been taped out, making ...
In this short video we show an LED light demo to ...
The LTC2380-24 is a versatile 24-bit SAR ADC that combines ...
In this short video we show an LED light demo to ...
02:46
Wireless Power enables applications where it is difficult ...
07:41
LEDs are being used in current luxury model automotive ...
With design sizes expected to increase by 5X through 2020, ...
01:48
Linear Technology’s LT8330 and LT8331, two Low Quiescent ...
The quality and reliability of Mill-Max's two-piece ...