Embedded Systems Conference
Breaking News
Comments
Newest First | Oldest First | Threaded View
old account Frank Eory
User Rank
Author
re: Test problems grow as chip integration increases
old account Frank Eory   2/20/2012 11:32:08 PM
NO RATINGS
I have been hearing about designers ignoring DFT since the 90s, and yet on every design team I have been a member of, DFT was always a major task and was addressed up front -- as a much a part of the chip requirements as any functional requirements. You're right, analog testing is still lacking automation and this is a big problem in reducing test time for AMS SoCs. Hopefully the EDA community will put some effort into that.

scanman
User Rank
Author
re: Test problems grow as chip integration increases
scanman   2/20/2012 10:49:12 PM
NO RATINGS
For too long designers have focussed on getting every bit of functionality and relegated test to the backend. However, DFT is taking foothold in almost all design groups, and helping ease the manufacturing problem. Most of DFT technology has been developed to tackle digital testing, and analog, m/s testing is still a problem, not well-defined and left to smart engineers to come up with solutions. Need more work in these areas to automate testing of SoCs populated by a mix of digital, analog, m/s cores and logic.

MSSN
User Rank
Author
re: Test problems grow as chip integration increases
MSSN   2/19/2012 12:31:22 PM
NO RATINGS
Breakpoints and infinite probes are a big difference between software and silicon debugging

Kinnar
User Rank
Author
re: Test problems grow as chip integration increases
Kinnar   2/18/2012 11:08:20 AM
NO RATINGS
Increasing no of peripherals and cores puts the "design for test" in a critical situation as the area covered by the test sets increases then the required by the actual chip. But this will be solved as the "Design for Test" is a hot topic among the researchers.

Kinnar
User Rank
Author
re: Test problems grow as chip integration increases
Kinnar   2/18/2012 11:05:53 AM
NO RATINGS
Testing and debugging Silicon Chips is much more complicated as compared to software programs. If the design does not work out there is no means of debugging and correcting once done. All the tests are made in simulation environment, where as in case of software you can come with as many versions of a simple .dll as well.

DrQuine
User Rank
Author
re: Test problems grow as chip integration increases
DrQuine   2/18/2012 4:10:00 AM
NO RATINGS
Fundamentally, testing and debugging silicon chips is the same problem as testing and debugging software programs. The only difference is that one ends up in silicon and wires whereas the other is stored in magnetic domains. Start by studying best practices in software programming and quality control.



Most Recent Comments
Susan Rambo
 
MFahmy0
 
cd2012
 
junko.yoshida
 
MikeD95101
 
betajet
 
junko.yoshida
 
Bill_Higdon
 
Tom_C
Radio
LATEST ARCHIVED BROADCAST
Overview: Battle-hardened veterans of the electronics industry have heard of the “connected car” so often that they assume it’s a done deal. But do we really know what it takes to get a car connected and what its future entails? Join EE Times editor Junko Yoshida as she moderates a panel of movers and shakers in the connected car business. Executives from Cisco, Siemens and NXP will share ideas, plans and hopes for connected cars and their future. After the first 30 minutes of the radio show, our listeners will have the opportunity to ask questions via live online chat.
Flash Poll
Like Us on Facebook

Datasheets.com Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
Special Video Section
LED lighting is an important feature in today’s and future ...
Active balancing of series connected battery stacks exists ...
After a four-year absence, Infineon returns to Mobile World ...
A laptop’s 65-watt adapter can be made 6 times smaller and ...
An industry network should have device and data security at ...
The LTC2975 is a four-channel PMBus Power System Manager ...
In this video, a new high speed CMOS output comparator ...
The LT8640 is a 42V, 5A synchronous step-down regulator ...
The LTC2000 high-speed DAC has low noise and excellent ...
How do you protect the load and ensure output continues to ...
General-purpose DACs have applications in instrumentation, ...
Linear Technology demonstrates its latest measurement ...
10:29
Demos from Maxim Integrated at Electronica 2014 show ...
Bosch CEO Stefan Finkbeiner shows off latest combo and ...
STMicroelectronics demoed this simple gesture control ...
Keysight shows you what signals lurk in real-time at 510MHz ...
TE Connectivity's clear-plastic, full-size model car shows ...
Why culture makes Linear Tech a winner.
Recently formed Architects of Modern Power consortium ...
Specially modified Corvette C7 Stingray responds to ex Indy ...