Embedded Systems Conference
Breaking News
Comments
Newest First | Oldest First | Threaded View
old account Frank Eory
User Rank
Author
re: Test problems grow as chip integration increases
old account Frank Eory   2/20/2012 11:32:08 PM
NO RATINGS
I have been hearing about designers ignoring DFT since the 90s, and yet on every design team I have been a member of, DFT was always a major task and was addressed up front -- as a much a part of the chip requirements as any functional requirements. You're right, analog testing is still lacking automation and this is a big problem in reducing test time for AMS SoCs. Hopefully the EDA community will put some effort into that.

scanman
User Rank
Author
re: Test problems grow as chip integration increases
scanman   2/20/2012 10:49:12 PM
NO RATINGS
For too long designers have focussed on getting every bit of functionality and relegated test to the backend. However, DFT is taking foothold in almost all design groups, and helping ease the manufacturing problem. Most of DFT technology has been developed to tackle digital testing, and analog, m/s testing is still a problem, not well-defined and left to smart engineers to come up with solutions. Need more work in these areas to automate testing of SoCs populated by a mix of digital, analog, m/s cores and logic.

MSSN
User Rank
Author
re: Test problems grow as chip integration increases
MSSN   2/19/2012 12:31:22 PM
NO RATINGS
Breakpoints and infinite probes are a big difference between software and silicon debugging

Kinnar
User Rank
Author
re: Test problems grow as chip integration increases
Kinnar   2/18/2012 11:08:20 AM
NO RATINGS
Increasing no of peripherals and cores puts the "design for test" in a critical situation as the area covered by the test sets increases then the required by the actual chip. But this will be solved as the "Design for Test" is a hot topic among the researchers.

Kinnar
User Rank
Author
re: Test problems grow as chip integration increases
Kinnar   2/18/2012 11:05:53 AM
NO RATINGS
Testing and debugging Silicon Chips is much more complicated as compared to software programs. If the design does not work out there is no means of debugging and correcting once done. All the tests are made in simulation environment, where as in case of software you can come with as many versions of a simple .dll as well.

DrQuine
User Rank
Author
re: Test problems grow as chip integration increases
DrQuine   2/18/2012 4:10:00 AM
NO RATINGS
Fundamentally, testing and debugging silicon chips is the same problem as testing and debugging software programs. The only difference is that one ends up in silicon and wires whereas the other is stored in magnetic domains. Start by studying best practices in software programming and quality control.



Top Comments of the Week
Like Us on Facebook

Datasheets.com Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
EE Life
Frankenstein's Fix, Teardowns, Sideshows, Design Contests, Reader Content & More
Max Maxfield

Awesome 3D Electronic Sculptures
Max Maxfield
10 comments
I recently received an email from someone we'll call Martin (because that's his name). Martin's message was short and sweet. In its entirety it read: "You need to see this!"

Jack Ganssle, Embedded.com

Processor Pinups
Jack Ganssle, Embedded.com
4 comments
My wife and I joke about our “adult” magazines. For her, those are the publications about beading. For me, they’re tool catalogs and Fine Woodworking magazine. The latter ...

Rajaram Regupathy, Cypress Semiconductor

Add USB Battery Charging Protocols to an Android-Based Design
Rajaram Regupathy, Cypress Semiconductor
Post a comment
Editorial Note: Excerpted from Unboxing Android: A hands on approach with real world examples, by Rajaram Regupathy, the author takes you through the process incorporating effective power ...

Rich Quinnell

Making the Grade in Industrial Design
Rich Quinnell
16 comments
As every developer knows, there are the paper specifications for a product design, and then there are the real requirements. The paper specs are dry, bland, and rigidly numeric, making ...

Special Video Section
The LT8640 is a 42V, 5A synchronous step-down regulator ...
The LTC2000 high-speed DAC has low noise and excellent ...
How do you protect the load and ensure output continues to ...
General-purpose DACs have applications in instrumentation, ...
Linear Technology demonstrates its latest measurement ...
10:29
Demos from Maxim Integrated at Electronica 2014 show ...
Bosch CEO Stefan Finkbeiner shows off latest combo and ...
STMicroelectronics demoed this simple gesture control ...
Keysight shows you what signals lurk in real-time at 510MHz ...
TE Connectivity's clear-plastic, full-size model car shows ...
Why culture makes Linear Tech a winner.
Recently formed Architects of Modern Power consortium ...
Specially modified Corvette C7 Stingray responds to ex Indy ...
Avago’s ACPL-K30T is the first solid-state driver qualified ...
NXP launches its line of multi-gate, multifunction, ...
Doug Bailey, VP of marketing at Power Integrations, gives a ...
See how to ease software bring-up with DesignWare IP ...
DesignWare IP Prototyping Kits enable fast software ...
This video explores the LT3086, a new member of our LDO+ ...
In today’s modern electronic systems, the need for power ...
Radio
LATEST ARCHIVED BROADCAST
EE Times Senior Technical Editor Martin Rowe will interview EMC engineer Kenneth Wyatt.
Flash Poll