The illumination source power is a show stopper for production use of EUV but it's not the only issue. The entire EUV infrastructure including masks and resists is unproven. Added to those problems is the belief by many that at this adoption rate EUV will need to change wavelength to 6.5 nm before it becomes a mainstream tool for manufacturing. There seems no end in sight to the development resources needed to make EUV lithography production worthy.
Below 10 nm, the 13.5 nm wavelength does not seem viable. For example, 7 nm with 0.5 NA is already fundamentally excluded. The window has essentially closed, and the purchasers of the NXE EUV tools are left with big bags.
For Cymer it seems end of summer not likely, maybe end of year. It's still a big slip which will impact ASML's intended rollout.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.