Theoretical conversion eff. limit for CIGS thin film, as predicted by NREL of DOE ( Boulder, CO ), is as high as 18 % ( as compared to 24 % for single xtal Si ) but only up to 16 % has been demonstrated so far in lab samples.
Because it has 4 components and separates into many quasi-stable phases depending on processing, CIGS thin film is a notoriously difficult material to control and shows variation in conversion eff. Many US companies have been struggling with this for years.
What I would like to know is what sort of production rate and yield TSMC is managing to get at their Pilot Line.
Otherwise this report is just PR flak.
NASA's Orion Flight Software Production Systems Manager Darrel G. Raines joins Planet Analog Editor Steve Taranovich and Embedded.com Editor Max Maxfield to talk about embedded flight software used in Orion Spacecraft, part of NASA's Mars mission. Live radio show and live chat. Get your questions ready.
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