Breaking News
Comments
Oldest First | Newest First | Threaded View
R G.Neale
User Rank
Author
re: Alternative NVM technologies require new test approaches, Part 1
R G.Neale   11/15/2012 9:29:23 AM
NO RATINGS
Peter did you mean this ""Much like other types of NVM technologies, a PCM cell must be formed before it displays the consistent switching necessary to be a memory element."" While PCM has a number of problems, the need to “form” the device should no longer be necessary. Imagine the problems, cost and time, of forming each bit of an 8G-bit array. Unless the author knows something that we are not being told forming effects should have gone away with the use of the crystallized active material as one electrode in the PCM structure. In the distant past, when PCM devices were fabricated with the active material in the amorphous state then there is a first switching (or forming) pulse. This is because the state of disorder, which determines the threshold voltage, of the as deposited film, differs from that of the same material after the first set/reset cycle, also there may have been some element separation that may have an impact on the value of the threshold voltage. While it is still necessary to empirically establish the optimum operating parameters by an iterative process for each new PCM device structure I think the author may have inadvertently confused that process with a need for forming. Once the optimum operating conditions are established with crystallized active electrodes there should be no need for forming. One other question have the annotations for Current and Voltage been accidentally transposed in Figure 7 or is this a power PCM device??

Kristin Lewotsky
User Rank
Author
re: Alternative NVM technologies require new test approaches, Part 1
Kristin Lewotsky   11/16/2012 11:13:35 PM
NO RATINGS
Good catch, Ron -- the axes labels on Figure 7 were indeed transposed; look for a corrected version to appear shortly. Kristin

resistion
User Rank
Author
re: Alternative NVM technologies require new test approaches, Part 1
resistion   11/17/2012 12:23:45 AM
NO RATINGS
When you have a resistance-based memory like PCM or STT MRAM and it needs to scale to lower currents, there don't seem to be any chip array testers (not individual cell probes) that can go down to nano amps for read currents. Hope this situation will change.



Datasheets.com Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
Like Us on Facebook
Special Video Section
LEDs are being used in current luxury model automotive ...
With design sizes expected to increase by 5X through 2020, ...
01:48
Linear Technology’s LT8330 and LT8331, two Low Quiescent ...
The quality and reliability of Mill-Max's two-piece ...
LED lighting is an important feature in today’s and future ...
05:27
The LT8602 has two high voltage buck regulators with an ...
05:18
Silego Technology’s highly versatile Mixed-signal GreenPAK ...
The quality and reliability of Mill-Max's two-piece ...
01:34
Why the multicopter? It has every thing in it. 58 of ...
Security is important in all parts of the IoT chain, ...
Infineon explains their philosophy and why the multicopter ...
The LTC4282 Hot SwapTM controller allows a board to be ...
This video highlights the Zynq® UltraScale+™ MPSoC, and sho...
Homeowners may soon be able to store the energy generated ...
The LTC®6363 is a low power, low noise, fully differential ...
See the Virtex® UltraScale+™ FPGA with 32.75G backplane ...
Vincent Ching, applications engineer at Avago Technologies, ...
The LT®6375 is a unity-gain difference amplifier which ...
The LTC®4015 is a complete synchronous buck controller/ ...
10:35
The LTC®2983 measures a wide variety of temperature sensors ...