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DrQuine
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re: IEEE 1149.1 'JTAG' revision could save billions
DrQuine   6/24/2013 2:15:06 AM
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I hope this facilitates quality control ... and doesn't allow for counterfeit devices to emulate the intended responses to the known test conditions and thereby sneak through the system.

Yield_Increase
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re: IEEE 1149.1 'JTAG' revision could save billions
Yield_Increase   6/28/2013 10:23:54 PM
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It appears that 1149.1-2013 has that covered.   I read this in IEEE Today's Engineer.

http://www.todaysengineer.org/2013/Jun/ic-counterfeiting-IEEE-1149-1-2013.asp

The new features of iJTAG 1149.1-2013 enable yield ramp up by using a thing called ECID, Electronic Chip ID, which correlates system test back to the wafer position.  They are using this for trackign the die from production to board/system test. 

Along with that, I guess, there is a 'free ride' for also preventing counterfeiting through re-marking the part.  The part will have a JTAG accessible ECID which tells you what speed grade, temperature grade or pass/fail status of the die.  So no longer can one scrunge the trash bins of Intel to find parts which didnt pass and then sell them off as working parts.  No longer can you erase the C temperature grade on the top of the chip and mark it as Industrial or AEC or MIL.

All good stuff in my view.

StorageEngineer
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why is IEEE 1149.1-2013 jtag in automotive?
StorageEngineer   6/29/2013 10:46:35 AM
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seems it could be used there.  wouldnt 1149.1-2013 JTAG apply to aerospace, defense, computing, storage, and networking as well?



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