Clearly at the leading edge, MLC NAND flash requires extensive ECC and also a controller that will keep moving data on so that all the memory cells get similar wear....as they can only do a limited number of read/write cycles and ECC to correct for altered bits adds to the wear.
One implication of this "wear leveling" is that at the extreme the effective capacity of a leading-edge NAND flash memory reduces over time.
I am not sure whether the manufacturers provide additional capacity so that the memory "wears down" toward the advertized capacity ...or they produce what they produce and reckon it is down to the controller to "manage" the situation.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.