In a NAND Functional Tester I implemented the algorithm to detect during Read/Verify the actual ECC required per Block and Device.
Applying repeatedly Erase/Program/Read/Verify to the same block emphasized the Endurance (measured in number of Erase/Program cycles) based on the evolution of ECC detected during Read/Verify.
Lately a customer ran, on an ONFI2.2 Chip with ECC Unit of 1117 Bytes and minimum required ECC 40 according to the spec, repeatedly, Erase/Program/Read/Verify cycles on the same Block. During the first cycle the ECC detected by the tester for that Block was 6, after 3K cycles ECC detected was 17, after 5K cycles ECC 29.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.