Flash corruption and read endurance are two issues that often get raised in our applications. The latest micros have better error detection and correction. We still see these types of failures with off-the-shelf SD Cards. SLC cards are much better but are often ten times too expensive. MLC/TLC cards are more cost effective but need to be managed carefully.
I expect that the data centers will drive the flash reliabillity and help the product to be better for everyone. It is a new technology, so it will take some time and effort to get to the reliability needed.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.