United Business Media EE Times


Search

HOMEMARKET INTELLIGENCE UNITFORUMSDESIGNNEW PRODUCTSCAREERSBLOGSCONTACTEVENTSSIGN UP!RSSMost Popular contentTrusted Sources

 


Other half of low-power design
Print this article Email this article Reprints RSS Digital Edition

EE Times


WILSON_RON

A great deal has been written about the challenges of low-power design for battery-operated system-level ICs. It has been observed that at 130 nm, both active power and leakage power are serious considerations. Techniques under development to deal with the problem include clock throttling, which has been used for some time; mixing of high-threshold and low-threshold transistors in the design; and scaling the voltage of blocks to match their required performance.

But those techniques won't always take us far enough. To meet some requirements, it will be necessary not just to scale voltage but also to vary voltage dynamically between zero and operating maximum, depending on whether a block is idle, working on a noncritical task or working to meet a demanding deadline. That lets the designer make sure that each block is supplied just enough voltage to run just fast enough to get its job done in time.

Of course we are talking about digital logic here. Voltage scaling for memories is a much different subject, and for analog circuits even raising the issue can get one throttled by a team of enraged analog designers. But, for digital logic, the promise is to slash energy consumption without harming performance.

But first . . .

There are substantial chip design issues involved. To begin with, logic cells are generally characterized around some nominal operating point, or perhaps between process corners, not continuously from zero to some maximum voltage. So there is characterization work to do just to find out what the minimum voltage is for a given path delay. There are also signal integrity issues. In general, signal integrity problems lessen as voltage decreases-unless while your voltage is going down, the voltage on the net next to you is going up. In that case, you are becoming more susceptible to an aggressor that is getting louder.

Top that off with serious issues about interfacing between blocks whose voltages vary dynamically and separately from each other, controlling the stability of blocks during voltage changes-or during power-down and power-up-and managing a clock network across multiple dynamic voltage domains, and you have an interesting problem.

But the hardware problem may be nothing compared with the problem of finding out from the software folks just what the minimum performance for a given task might be. They are unlikely to have ever asked themselves that question.

Ron Wilson covers microprocessors, programmable/reconfigurable logic and the chip design process. He can be reached at rwilson@cmp.com.





The views and opinions expressed in this column are strictly those of the author and should not be taken as an editorial position of EE Times or any of its other editors, publications or Web sites.


  Free Subscription to EE Times
First Name Last Name
Company Name Title
Email address
  Click here for your Free Subscription to EETimes Europe
 
CAREER CENTER
Looking for a new job?
SEARCH JOBS
SPONSOR

RECENT JOB POSTINGS
CAREER NEWS
Engineers take a bad year in stride
According to the findings of the 2009 EE Times Global Salary & Opinion Survey, generally, engineers are satisfied with their career choices.

For more great jobs, career related news, features and services, please visit EETimes' Career Center.


All White Papers »   

 
Education and
Learning


Learn Now:












Home | About | Editorial Calendar | Feedback | Subscriptions | Newsletter | Media Kit | Contact | Reprints|  RSS|   Digital|  Mobile
Network Websites
International
Network Features




All materials on this site Copyright © 2009 TechInsights, a Division of United Business Media LLC All rights reserved.
Privacy Statement | Terms of Service | About