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vazona
Member Since: June 23, 2006
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Resistive Non-Volatile Memory at IEDM 2013
Blog  
12/17/2013   6 comments
Here’s a review of the recent IEDM 2013 papers on resistive non-volatile memory.
Understanding the basics of image and carrier suppression measurements
Design How-To  
4/4/2007   Post a comment
In the wireless world, direct upconversion RFICs are prone to several sources of error, and measurements such as carrier and image suppression are required to accurately characterize the effects of these errors.


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What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.

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