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JanineLove
Member Since: May 24, 2012
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posted in August 2013

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Comment: Here we go! - JanineLove - 8/30/2013
Comment: Process - JanineLove - 8/30/2013
Test & Measurement Product Roundup: August 2013
News & Analysis  
8/28/2013   2 comments
Here’s a digest of the latest test & measurement products making news this month.
Comment: Re: How to teach - JanineLove - 8/27/2013
Comment: How to teach - JanineLove - 8/26/2013
Comment: Scope probes - JanineLove - 8/26/2013
Comment: Re: Process - JanineLove - 8/26/2013
Comment: Process - JanineLove - 8/26/2013
Comment: Toolbox - JanineLove - 8/26/2013
Comment: Liquor - JanineLove - 8/23/2013
Comment: Spread the word - JanineLove - 8/23/2013
Probing Matters
Blog  
8/22/2013   1 comment
During the design phase, efforts to optimize performance depend on the quality of your test. How do you ensure you've got the best probe for the job?
Comment: Re: NI Week - JanineLove - 8/21/2013
Comment: Watches - JanineLove - 8/20/2013
Comment: Re: Cisco Ubiqusys - JanineLove - 8/20/2013
Comment: Not sure... - JanineLove - 8/20/2013
Comment: Re: Stayin' Alive - JanineLove - 8/16/2013
Comment: Stayin' Alive - JanineLove - 8/16/2013
Comment: Re: NI Week - JanineLove - 8/16/2013
Comment: NI Week - JanineLove - 8/16/2013
Comment: New feature - JanineLove - 8/16/2013
MOSFET Characteristic Variation & Reliability Degradation
Blog  
8/15/2013   1 comment
MOSFETs face critical issues such as characteristic variation and reliability degradation. Takuro Nishimura of Agilent Technologies discusses methods to set up measurement apparatus, explore RTN and BTI, and solve characteristic variation and reliability degradation issues
Comment: Re: Safety - JanineLove - 8/15/2013
Comment: Re: Sensitivity? - JanineLove - 8/14/2013
Comment: Re: Helium - JanineLove - 8/14/2013
Comment: Power Integrity - JanineLove - 8/14/2013
Comment: Safety - JanineLove - 8/14/2013
Comment: Cert Lab - JanineLove - 8/13/2013
Comment: NI Week - JanineLove - 8/12/2013
Comment: Smart People - JanineLove - 8/12/2013
Test Challenges for New Engineers
Blog  
8/9/2013   9 comments
Steve Sandler has a great sense of humor and an interesting technical background. He is one of the most curious and enthusiastic people I’ve met. I recently asked him to be a part of my Profiles in Test series.
Comment: Re: More on Zync - JanineLove - 8/7/2013
Comment: Re: More on Zync - JanineLove - 8/7/2013
Comment: More on Zync - JanineLove - 8/6/2013
Comment: More to come - JanineLove - 8/6/2013
Custom Hardware Design Is Dead
News & Analysis  
8/6/2013   25 comments
NI Week kicks off with record attendance
Comment: IEEE EMC2013 - JanineLove - 8/5/2013
Comment: RF test - JanineLove - 8/5/2013
Test & Measurement New Product Roundup
News & Analysis  
8/5/2013   3 comments
Here’s a roundup of test & measurement in EE news during the past month. New releases include signal generator, scope, probes, and software, among others.
Comment: Re: Backhaul? - JanineLove - 8/2/2013
Comment: Re: Backhaul? - JanineLove - 8/2/2013


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