SAN JOSE, Calif. -- Novellus Systems Inc. has rolled out a suite of ashable hardmask (AHM) films, said to have up to 25 percent greater etch selectivity than rival amorphous carbon films.
The AHM family of films has demonstrated die yield improvements as much as 7 percent--when coupled with Novellus' integrated edge bevel removal (EBR) technology, according to the San Jose-based fab tool maker.
Novellus' Vector PECVD platform features an integrated EBR capability that provides complete removal of the AHM film within a 1-mm transition zone. This sharp transition ensures that edge die have the required AHM thickness necessary for CD uniformity control within 2-mm from the wafer's edge.
"Novellus' AHM films meet the high-density, high-aspect ratio patterning requirements necessary for sub-32-nm devices," said Kevin Jennings, senior vice president for Novellus' PECVD business unit, in a statement. "Coupled with the proven productivity of the Vector platform, Novellus' AHM solution is the low cost, high volume manufacturing choice for these advanced optical films."