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Content tagged with Test & Measurement
posted in July 2012
Understanding the IP3 specification and linearity, Part 2
Design How-To  
7/30/2012   2 comments
Learn how to evaluate and interpret IPn to assess the linearity of your electronic device.
No! It's not fair!
Blog  
7/25/2012   10 comments
I really don’t think it's "cricket" for people to tempt me in this way, because I am a weak man…
Industry View: LeCroy's CTO on the strategic advantage you might be missing
Blog  
7/25/2012   6 comments
Planning for test, what the industry needs to do next, and the challenges of taking scopes to 12-bit ADCs.
Multitest handler simplifies high-power IC test
Product News  
7/25/2012   Post a comment
The MT9928 gravity handler provides easy integration with test interface boards and Kelvin contactor to form 500 A test system.
Geotest PXI DMM doubles as waveform analyzer
Product News  
7/25/2012   Post a comment
The GX2065 integrates a 3-MHz, 16-bit isolated-input digitizer for acquiring and analyzing waveforms.
Understanding the IP3 specification and linearity, Part 1
Design How-To  
7/25/2012   3 comments
To best interpret results—and recognize systematic errors or artifacts—find out what intercept-point specifications really mean.
LeCroy introduces 10GBASE-R and 40/100GBASE-R electrical/optical full test lineup
Product News  
7/25/2012   Post a comment
LeCroy Corporation offers new software and hardware test solutions for 10GBase-R and 40/100GBase-R4 Ethernet.
Audio analyzer features high functionality, low price
Product News  
7/25/2012   Post a comment
The dScope Series IIIE audio analyzer, dubbed the "Essentials' package, is targeted for customers who don’t need the entire feature set of the top range systems.
HDMI video and audio capture card targets device testing
Product News  
7/25/2012   Post a comment
ADLINK Technology, Inc. has released a full HD HDMI video and audio capture card that enables one-card acquisition of full analog/digital video and digital audio input.
Is an emphasis on games a sign of decadence?
Blog  
7/24/2012   17 comments
Are games for children and something to be put aside when we get older and life gets serious? Or should life never get serious? And how does electronics play into that?
Six considerations when evaluating network application test solutions
Design How-To  
7/19/2012   2 comments
In light of today’s "hyper-active" environment, here are six critical components to look for when evaluating application test systems
Industry View: Test talk with Frost & Sullivan
Blog  
7/18/2012   1 comment
Jessy Cavazos, Frost & Sullivan’s industry director for test & measurement research, weighs in who's got big plans, who's got new resources, and which company grew more than 30% last year.
NI PXIe tester measures four channels in one slot
Product News  
7/18/2012   Post a comment
Source-measure unit lets users tune response for any DUT load.
Bruker AFM x-ray units boost 450-mm wafer production
Product News  
7/18/2012   Post a comment
Targeted at semiconductor metrology, the AFM covers a broad range of roughness, depth, and CDs, while the x-ray systems perform wafer analysis in front- and back-end processing.
Ensuring synchronous sampling of multiple high-frequency signal channels
Design How-To  
7/18/2012   3 comments
Distributing a common clock reference to all digitizers nominally delivers synchronous sampling across a large number of channels, but how do you measure sub-nanosecond time delays between them?
Spectrometer operating in visible and near-infrared
Design How-To  
7/18/2012   3 comments
SWIFTS (Stationary Wave Integrated Fourier Transform Spectrometer) permits a drastic reduction of the size of spectrometers while maintaining, even improving, their performances.
Agilent acquires AT4 for LTE wireless testing
News & Analysis  
7/16/2012   Post a comment
Agilent Technologies Inc. and AT4 wireless have signed a definitive agreement for Agilent to acquire the assets of AT4 wireless’ Test Systems business.
IC supplier, customer cooperation methodologies drive up electronics system quality
Design How-To  
7/13/2012   1 comment
Although IC manufacturers have been extremely successful in reducing defects, on the other hand a significant part of the quality drive for printed-circuit-board module makers is stemming from reducing electrical over-stress (EOS), electrostatic discharge (ESD), and cases of no-trouble-found (NTF). Solution of these problems requires the involvement of the PCB module maker and the automotive manufacturer as well.
Top 10 Test & Measurement articles of 2012 (so far!)
Design How-To  
7/10/2012   Post a comment
Everyone is being asked to think about test these days, and that is reflected in the top articles so far this year.
Russian component market to grow 9.5% in 2012, says study
News & Analysis  
7/5/2012   1 comment
The Russian electronics component market is set to grow by 9.5 percent in 2012 to reach an annual size of about $2.6 billion, according to a report prepared by the Association of Suppliers of Electronic Components.
Peregrine 8 GHz SP4T switch targets test-and-measurement/ATE applications
Product News  
7/3/2012   Post a comment
Peregrine Semiconductor Corporation (Peregrine) has released the SP4T PE42540 RF switch.
Teseq magnetic field generates fields Up To 1200 A/m
Product News  
7/2/2012   Post a comment
Designed for testing to IEC 61000-4-8, IEC 61000-4-9 and IEC 61000-4-10
Averna Wideband RF recorder captures real-world RF signals
Product News  
7/2/2012   Post a comment
The RP-5300 RF Recorder is a field-ready multi-channel RF Recorder for applications covering 330 MHz to 2.5 GHz.
Phase noise analyzers offer lowest residual phase noise performance
Product News  
7/2/2012   Post a comment
The NXA series of phase noise analyzers from Noise Extended Technologies (NoiseXT) simplifies phase noise testing by incorporating a one-box system design
Rohde & Schwarz adds frequency converter measurements to ZNB vector network analyzers
Product News  
7/2/2012   Post a comment
The R&S ZNB-K4 software option for the Rohde & Schwarz R&S ZNB series of vector network analyzers (VNAs) extends the instruments capability by mixer and frequency converter measurements.
110 GHz VNA system delivers 4-port measurement
Product News  
7/2/2012   Post a comment
Anritsu Company’s VectorStar ME7838A broadband Vector Network Analyzer (VNA) platform features 4-port measurement
Option enables VNA to measure noise figure from 70kHz to 125 GHz
Product News  
7/2/2012   Post a comment
Noise figure measurement capability is available for Anritsu Company’s VectorStar MS4640 and ME7838A analyzers.
Handheld cable and antenna analyzer delivers 8-hour battery use
Product News  
7/2/2012   Post a comment
The S33IL Cable and Antenna Analyzer by Anritsu Company provides high-performance cable and antenna analysis.
VectorStar system extends system frequency coverage to 750 GHz
Product News  
7/2/2012   Post a comment
Anritsu Company’s ME7838A VectorStar 4-port configuration extends the Vector Network Analyzer (VNA) measurement system to 750 GHz and higher.
E-band emission test solution achieves best-in-class dynamic range
Product News  
7/2/2012   Post a comment
The Anritsu MS2830A signal analyzer features an external mixer design that achieves a best in-class-dynamic range.
Agilent claims world's fastest USB power sensors
Product News  
7/2/2012   Post a comment
Agilent Technologies Inc. released the Agilent U2020 X-series, which it claims incorporates the world's fastest USB power sensors.
Agilent debuts PA module design for next release of Advanced Design System
Product News  
7/2/2012   Post a comment
Agilent Technologies Inc. announced new capabilities for RF power amplifier design in the next major release of Agilent's Advanced Design System.


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