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posted in July 2013
Japan to Form Power Device Initiative
News & Analysis  
7/31/2013   11 comments
Unlike the CE market, there are no established testing procedures for power devices used in vehicles or other high-voltage, high-current infrastructure equipment. It could result in life and death issues, warned an Advantest executive.
Car Hacking: NXP Pushes Flexible Security
News & Analysis  
7/11/2013   25 comments
NXP early on realized that automotive security could benefit from the company’s experience in developing a "secure element" – successfully deployed in millions of smartcards.


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Aloha from EEWeb
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Just a few minutes ago as I pen these words, I posted this blog about this month's Cartoon Punchline Competition over on EEWeb.com.