Eden Prairie, Minn.Providing comprehensive signal integrity analysis for SERDES (serializer-de-serializer), graphics, and clock applications, Wavecrest is rolling out its SIA Family of Signal Integrity Analysis Solutions Integration Kits for the Agilent 93000, Credence Sapphire, and Teradyne Flex ATE (automatic test equipment) systems. These kits let a Wavecrest SIA be integrated into a mainframe for manufacturing, or as a roll-up approach for characterization work.
According to Wavecrest president and CEO Dennis Leisz, users of any of these ATE systems will now have the ability to rapidly characterize devices and boards, and also correlate results during high volume production. "This will help silicon developers bring products to market faster," avows Leisz. "It will give you confidence that you have an accurate, repeatable, and compliant signal integrity measurement tool."
ATE System Timing
Leisz emphasizes that his company's SIA offers advantages over software serial I/O tools and BERTs (bit error rate testers) by providing diagnostic and jitter measurement capabilities, faster test times, and a development suite of standard and programmable test programs.
This is significant, as during debug and characterization, it can be nearly impossible to accurately test signal integrity of devices that run asynchronous to ATE system timing.
The SIA Family's Gigaview software tools deliver true compliance measurements and diagnostic information to characterize and predict long-term performance of a device.
The Gigaview software quantifies RJ (random jitter), DJ (deterministic jitter), DDJ (data-dependent jitter), PJ (periodic jitter), and TJ (total jitter). It does that to a 10-15 BER. These parameters are required by many SERDES and clock specs from the IEEE and ANSI.
To address the need for speed in production testing, the company's SIA reduces test times by making timing and amplitude measurements in parallel. Peak-to-peak and standard-deviation measurements on a clock can be completed in less than 5-ms, while tests for SERDES applications at 4.5-Gbits/s can be completed in less than 80-ms.
Wavecrest includes a graphical characterization suite that provides over 33 tools for characterization that correlates to design. The supplied suites are also claimed to be robust enough so that no additional lines of software need to be written. Wavecrest also provides a so-called PAPI (production application programming interface) library to ease test program development and make it faster.
The SIA Integration Kit for the Agilent 93000 ATE system is currently available at ISE Labs in Fremont, California for demonstration purposes and short test production runs. Here's a photo of a typical SIA.
For more information, contact Wavecrest, 7626 Golden Triangle Dr., Eden Prairie, Minn. 55344. Phone: (800) 733-7128, or (952) 831-0030. Fax: (952) 831-4474. E-mail: firstname.lastname@example.org
Wavecrest, 800-733-7128 or 952-831-0030, www.wavecrest.com