A bench-size instrument, the 7700 integrated microwave test system from Aeroflex is an ATE system-in-a-box intended for rapid production testing of microwave and RF components and modules. The 7700 employs Aeroflex’s synthetic architecture and Common Platform hardware to improve measurement throughput.
A measurement-console test executive controls all aspects of the production test process, including the DUT, remote switching hardware, thermal chambers, and more. Using production test sequences provided by the base model, the 7700 provides the functionality and measurements of a vector signal generator, spectrum analyzer, vector network analyzer, oscilloscope, power meter, frequency counter, noise figure meter, and phase noise analyzer. According to the manufacturer, the 7700’s tight coupling of signal generation, measurements, and DUT control increases throughput significantly over conventional rack-mount ATE systems.
The 7700 microwave test system has a frequency range of 1 MHz to 6 GHz, with options up to 32 GHz. It offers a complete measurement suite, including S-parameters for full characterization of devices such as low-noise amplifiers, variable crystal oscillators, and transceiver modules. Key specifications include an RF modulation bandwidth of 90 MHz, frequency switching times of less than 1 ms, phase noise of –115 dBm (2 GHz, 20 kHz offset), residual noise floor of less than –120 dBm, and a dynamic range of greater than 100 dB.
More information: www.aeroflex.com/atc2012/7700%20data%20sheet.pdf